Trilayer cantilevers
Redefining sensitivity and adaptability in AFM applications
c-sense introduces its innovative Trilayer cantilever Technology, offering unparalleled sensitivity and versatility for advanced Atomic Force Microscopy (AFM) applications.
This breakthrough design achieves up to 4x higher sensitivity than traditional silicon-based cantilevers and is compatible with both opaque and conductive liquids, enabling reliable performance across various AFM applications.
Our trilayer structure allows integration with advanced electronics, such as pre-amplifiers and actuators, setting a new standard for applications requiring precise force sensitivity and dynamic response.
High-sensitivity applications in one device:
Achieve unmatched analysis with the versatility to support KPFM, Conductive-AFM, electrical probing, and more, all in a single tool.
Unmatched Features:
- Up to 4x higher sensitivity
- Compatible with complex fluids and materials
- Supports integration with advanced electronics
Discover the future of high-precision AFM with our Trilayer Cantilever Technology at the Products page. For further technical details regarding the Trilayer cantilever, refer to the Nature Electronics publication.