NanoInspect Nanomechanical microscope: Correlated Analysis with AFM and Nanoindentation
We are thrilled to share that the ‘NanoInspect’ project is nearing its completion! Our team has achieved the first successful correlated measurements using nanoindentation and AFM topography, marking a significant milestone. This breakthrough product will be available on the market soon, offering cutting-edge capabilities for the research community and industry alike.
Key Advantages of the NanoInspect Nanomechanical Microscope:
- Coupled Techniques: Seamless integration of nanoindentation and AFM in a single experiment, providing unmatched flexibility.
- Real-Time Decision-Making: Adapt your sequence of indentations and surface analyses based on immediate data feedback.
- Precision Positioning: Achieve sub-μm accuracy when positioning indentations, enabling cumulative experiments.
- Enhanced Navigation: Discover new points of interest with nm-resolved AFM topographic information.
- Efficiency: Automated sample movement reduces time and records precise location data.
- Versatility: Conduct experiments in harsh environments, including low temperatures and inert atmospheres, enabling new research avenues beyond.
Collaboration & Funding: This project is in collaboration with Universität für Weiterbildung Krems, Alemnis AG, and EPFL, and is funded by the Eurostars Programme, Innosuisse, and the FFG Austrian Research Promotion Agency.
Stay tuned as we approach the market launch of NanoInspect and bring this technology to your lab!